The thermogravimetric and calorimetric analyses allow estimating the stability or degradation of a material/compound with temperature and to measure phase changes or conversion temperatures. The TA SDT Q600 instrument provides simultaneous measurement of weight change (TGA) and true differential heat flow (DSC) on the same sample from RT to 1.500 ̊C. TGA/DSC measurements can be performed under controlled atmosphere (dry air, wet air, nitrogen, carbon dioxide, argon, helium) with digital mass flow controllers. Secondary reactive gases (O₂, Ar/H₂ mixtures) can be carried directly on the sample. Recommended sample quantity is in the 3-20 mg range.
TGA/DSC analyzer can be connected to a residual gas analyzer (RGA) Hiden-HPR20 QIC with a capillary sampling system fitted to the purge exhaust gas exit of TA SDT Q600. The HAL 7 quadrupole scan range is comprised between 1 and 300 a.m.u., leading to the identification of gaseous compounds generated during the TGA/DSC scan.

There is also a dilatometer for the evaluation of shrinkage and / or expansion of pellets of standard size in the range 500 / 5000μm. The materials analyzed can be of various nature (polymers, glasses, ceramics, metals as bulk or powders). By varying the temperature (from room temperature to 1600 ° C with maximum ramp of 20 ° C / min) is recorded dilation and evaluated the coefficient of expansion. The measure of pellet bending and/or softening at high temperature is also possible.

Quantitative analyses of trace and ultra-trace elements are performed by using a mass spectrometer with inductively coupled plasma source (ICP-MS) and quadrupole analyzer. Typically the samples analyzed are liquid solutions injected into the system and then ionized by the plasma. However, the concentrations of elements can be analyzed directly from solid matrix by laser ablation.

The Secondary Ion Mass Spectrometry (SIMS) allow the surface analysis of conductive and insulating materials, with the possibility of having the qualitative determination of almost all elements up to concentrations of ppm or, for some elements , ppb. The principle of operation is as follows: the sample to be analyzed is placed in a chamber at 10^-9 mbar and is sputtered by a collimated beam of O²⁺ ions bombarding the surface and causing the emission of particles and their ionization. These particles are focused into the analyzer quadrupole and identified as mass/charge ratio. The potential of the sample surface (if insulator) is compensated with a low energy electrons beam. With this technique the elemental in-depth distribution up to few µm depth can also be analyzed.